SemiSol Analytik GmbH
SemiSol Analytik GmbH

We are the experts in the most modern surface analysis methods

Certified by leading silicon- and wafer manufacturers

 Accreditation for DIN17025 ongoing

      



surface analysis

SIMS, TOF-SIMS

ICP-MS, ICP-OES

TXRF, direct TXRF

REM, TEM

FTIR

 

layer analysis

ICP-MS, ICP-OES

TXRF

 

Bulk analysis

NAA

 

 

 

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